This inventor holds 1 USPTO granted patent and 2 published patent applications and 5 EPO patents. Top assignee: Unversität Zürich. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022
Title: The Innovations of Stefan Kleiser
Introduction
Stefan Kleiser is an accomplished inventor based in Grenzach-Wyhlen, Germany. He has made significant contributions to the field of optical measurement technology. His work focuses on enhancing the accuracy of measurements in scattering media, which has important applications in various scientific and medical fields.
Latest Patents
Stefan Kleiser holds a patent for an "Apparatus for measuring optical parameters in scattering media." This spectrophotometric apparatus is designed to determine optical parameters by measuring the attenuation of light as it propagates through a scattering medium. The invention addresses the challenges posed by light being guided in an intermediate optical layer, which can affect measurement accuracy. To mitigate this issue, the apparatus employs either a multitude of optical barriers or limits the angular range of emitted or received light. These innovations lead to improved precision, particularly beneficial for applications such as oximeters. Additionally, the apparatus includes features that enhance its applicability on curved surfaces, such as the skulls of neonates.
Career Highlights
Stefan Kleiser is affiliated with the University of Zurich, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications and innovative approach to optical measurement.
Collaborations
Stefan has collaborated with notable colleagues, including Martin Wolf and Daniel Ostojic. Their combined expertise contributes to the advancement of technology in their respective fields.
Conclusion
Stefan Kleiser's contributions to optical measurement technology exemplify the impact of innovative thinking in scientific research. His patent for measuring optical parameters in scattering media showcases his commitment to improving measurement accuracy and applicability in critical areas.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
