The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2022

Filed:

Oct. 19, 2018
Applicant:

Universitat Zurich, Zurich, CH;

Inventors:

Stefan Kleiser, Grenzach-Wyhlen, DE;

Martin Wolf, Zurich, CH;

Daniel Ostojic, Zurich, CH;

Nassimsadat Nasseri, Zurich, CH;

Assignee:

Universität Zürich, Zürich, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/1455 (2006.01);
U.S. Cl.
CPC ...
A61B 5/14552 (2013.01); A61B 2562/0238 (2013.01); A61B 2562/182 (2013.01); A61B 2562/185 (2013.01);
Abstract

A spectrophotometric apparatus for determining optical parameters in a scattering medium based on the measurement of attenuation of light propagating through said medium by diffusion. To eliminate the detrimental effect of light being guided in an intermediate optical layer between a surface of the medium and a contact surface of the apparatus, either a multitude of optical barriers may be formed in the contact surface or the angular range over which light is emitted or received by the apparatus may be limited by appropriate means. With both of these alternative approaches, light propagation in the intermediate layer can be suppressed, leading to increased measurement accuracy. This is particularly beneficial for building an oximeter with improved precision. Further aspects include features for improving the applicability of the apparatus on curved surfaces such as the strongly curved skulls of neonates.


Find Patent Forward Citations

Kleiser, Stefan. (2022). Apparatus for measuring optical parameters in scattering media (U.S. Patent No. 11246517). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11246517

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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