Jena, Germany

Stefan Heist

USPTO Granted Patents = 2 

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2019

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2 patents (USPTO):Explore Patents

Title: Innovations of Stefan Heist

Introduction

Stefan Heist is a notable inventor based in Jena, Germany. He has made significant contributions to the field of spatial measurement technologies. With a total of 2 patents, his work focuses on innovative methods and devices for measuring surfaces.

Latest Patents

One of his latest patents is titled "Device and method for spatially measuring surfaces." This invention includes a projector that projects patterns into an object space, along with two cameras that capture images of the surface. The control and evaluation unit activates the cameras and evaluates the images to determine spatial coordinates of surface points through triangulation. Another significant patent is the "Method and device for the contact-free measurement of surface contours." This method involves projecting a sequence of aperiodic stripe patterns onto a surface and capturing images to identify corresponding points, ultimately determining spatial coordinates via triangulation.

Career Highlights

Stefan Heist has worked with prominent organizations such as Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. and Friedrich-Schiller-Universität Jena. His experience in these institutions has contributed to his expertise in measurement technologies.

Collaborations

He has collaborated with notable colleagues, including Peter Kühmstedt and Gunther Notni, enhancing the development of his innovative projects.

Conclusion

Stefan Heist's contributions to spatial measurement technologies through his patents and collaborations highlight his role as a significant inventor in this field. His work continues to influence advancements in non-contact measurement methods.

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