The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
May. 04, 2016
Fraunhofer-gesellschaft Zur Förderung Der Angewandten Forschung E.v., München, DE;
Friedrich-schiller-universität Jena, Jena, DE;
Stefan Heist, Jena, DE;
Gunther Notni, Jena, DE;
Kevin Srokos, Weimar, DE;
Peter Lutzke, Jena, DE;
Ingo Schmidt, Jena, DE;
Peter Kühmstedt, Jena, DE;
FRIEDRICH-SCHILLER-UNIVERSITAET JENA, Jena, DE;
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN, Munich, DE;
Abstract
A device, for spatially measuring surfaces, includes a projector for projecting patterns into an object space, two cameras for recording pictures of a surface in the object space, and a control and evaluation unit for activating the cameras and evaluating the pictures. The projector includes a light source, a projection lens, at least one rotatably arranged pattern structure, and a drive for rotating the at least one pattern structure. The control and evaluation unit to: activate the cameras for simultaneously recording a picture at each of a plurality of successive points in time; identify corresponding points in the picture planes of the cameras, by way of evaluating a correlation function between the sequences of brightness values acquired for potentially corresponding points and maximizing a value of the correlation; and determine spatial coordinates of surface points by way of triangulation on the basis of the identified corresponding points.