This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Friedrich-Schiller-Universitaet Jena. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2019
Title: The Innovative Contributions of Peter Lutzke
Introduction
Peter Lutzke is a notable inventor based in Jena, Germany. He has made significant contributions to the field of spatial measurement technology. His innovative approach has led to the development of a unique device that enhances the accuracy of surface measurements.
Latest Patents
Lutzke holds a patent for a "Device and method for spatially measuring surfaces." This device includes a projector that projects patterns into an object space, two cameras for capturing images of surfaces, and a control and evaluation unit. The projector is equipped with a light source, a projection lens, and a rotatable pattern structure. The control unit activates the cameras to record images simultaneously at various points in time. It identifies corresponding points in the camera images by evaluating a correlation function and determines spatial coordinates through triangulation. This innovative device has the potential to improve measurement accuracy in various applications.
Career Highlights
Throughout his career, Peter Lutzke has worked with esteemed organizations such as the Fraunhofer Society for the Advancement of Applied Research and Friedrich Schiller University Jena. His experience in these institutions has allowed him to refine his skills and contribute to groundbreaking research in his field.
Collaborations
Lutzke has collaborated with talented individuals, including Kevin Srokos and Stefan Heist. These partnerships have fostered a creative environment that has led to the development of innovative solutions in spatial measurement technology.
Conclusion
Peter Lutzke's contributions to the field of spatial measurement are noteworthy. His patented device showcases his innovative spirit and dedication to advancing technology. His work continues to inspire future developments in measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile