This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Friedrich-Schiller-Universitaet Jena. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2019
Title: Kevin Srokos: Innovator in Spatial Measurement Technology
Introduction
Kevin Srokos is a notable inventor based in Weimar, Germany. He has made significant contributions to the field of spatial measurement technology. His innovative approach has led to the development of a unique device that enhances the accuracy of surface measurements.
Latest Patents
Kevin Srokos holds a patent for a "Device and method for spatially measuring surfaces." This device includes a projector that projects patterns into an object space, two cameras for capturing images of surfaces, and a control and evaluation unit. The projector is equipped with a light source, a projection lens, and a rotatable pattern structure. The control unit activates the cameras to record images simultaneously at various points in time. It identifies corresponding points in the images by evaluating a correlation function and determines spatial coordinates through triangulation. This innovative device has the potential to improve measurement accuracy in various applications.
Career Highlights
Throughout his career, Kevin has worked with prestigious institutions such as Friedrich Schiller University Jena and Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. His work in these organizations has allowed him to refine his skills and contribute to advancements in measurement technology.
Collaborations
Kevin has collaborated with notable colleagues, including Stefan Heist and Gunther Notni. Their combined expertise has fostered a productive environment for innovation and development in their respective fields.
Conclusion
Kevin Srokos is a distinguished inventor whose work in spatial measurement technology has made a significant impact. His patented device showcases his innovative spirit and dedication to advancing measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile