The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Aug. 13, 2014
Fraunhofer-gesellschaft Zur Foerderung DE Angewandten Forschung E.v., Munich, DE;
Abstract
Method and device for non-contact measuring of surface contours. A sequence of stripe patterns, formed from a plurality of stripes of equal stripe direction are projected on a surface to be measured, wherein the stripe patterns are each aperiodic and have a sinusoidal brightness distribution and wherein, during the projecting of each of the stripe patterns, at least one image of the surface is captured by at least one camera. By the stripe pattern projected on the surface, corresponding points in the image planes of a camera and of a projection device used for projecting, or in the image planes of the cameras, are then identified by maximizing a correlation between sequences of brightness values recorded for each of the points, whereupon spatial coordinates of surface points on the surface are determined via triangulation on the basis of points identified as corresponding.