Srikrishna H Nadig

Title: Innovations of Srikrishna H Nadig

Introduction

Srikrishna H Nadig is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of technology, particularly in the area of clock recovery and power loss measurement in electronic devices. With a total of four patents to his name, his work has had a considerable impact on the industry.

Latest Patents

One of his latest patents is titled "Reference clock recovery for 'eye' measurements." This method involves recovering a clock from a serial data stream to produce 'eye' diagram measurements. It includes determining an initial recovered clock based on transition edges and calculating time interval error values as a function of these edges. The complete set of time interval error values is then lowpass filtered to reconstruct the clock for the serial data stream.

Another significant patent is focused on the "Identification of average total loss and switching loss in duty cycle and/or frequency variation signals acquired across a switching device using a DSO." This invention measures Total Average Power Loss and isolates different power loss components in switching devices like MOSFETs, BJTs, and IGBTs. It allows for the separation of components such as Turn Ton Loss and Turn Toff Loss, providing valuable insights into conduction loss in switching power supplies.

Career Highlights

Srikrishna H Nadig is currently employed at Tektronix, Inc., where he continues to innovate and develop new technologies. His work has been instrumental in advancing the understanding of power loss in electronic devices, contributing to more efficient designs and applications.

Collaborations

Some of his notable coworkers include P E Ramesh and Roger Lo, who have collaborated with him on various projects and patents.

Conclusion

Srikrishna H Nadig's contributions to technology through his patents and work at Tektronix, Inc. highlight his role as an influential inventor in the field. His innovative methods for clock recovery and power loss measurement continue to shape advancements in electronic engineering.