Sreeram Chandrasekaran

Title: Sreeram Chandrasekaran: Innovator in Repeater Defect Detection

Introduction

Sreeram Chandrasekaran is a notable inventor based in Santa Clara, CA. He has made significant contributions to the field of defect detection in semiconductor manufacturing. With a total of 2 patents, his work focuses on enhancing the efficiency and accuracy of defect analysis.

Latest Patents

Chandrasekaran's latest patents revolve around the concept of repeater defect detection. This innovative approach allows defects from a hot scan to be saved in various forms of persistent storage, including random access memory and split databases. The persistent storage can utilize a patch-based virtual inspector virtual analyzer (VIVA) or local storage. His patents detail how repeater defect detection jobs can be determined, enabling wafers to be inspected based on these jobs. Furthermore, the analysis of repeater defects allows for corresponding defect records to be retrieved from persistent storage, with results being returned to a high-level defect detection controller.

Career Highlights

Sreeram Chandrasekaran is currently employed at Kla Tencor Corporation, a leading company in the semiconductor industry. His work has been instrumental in advancing technologies that improve defect detection processes. His innovative solutions have garnered attention and respect within the field.

Collaborations

Chandrasekaran has collaborated with several talented individuals, including Eugene Shifrin and Bjorn Brauer. These collaborations have contributed to the development of cutting-edge technologies in defect detection.

Conclusion

Sreeram Chandrasekaran is a prominent figure in the realm of semiconductor innovation, particularly in the area of repeater defect detection. His contributions continue to shape the future of defect analysis in the industry.