This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignees: Marvell Asia Pte., Ltd., Sima Technologies, Inc.. Active years: 2024-2026.
Company Filing History:
Years Active: 2024-2026
Title: Sounil Biswas: Innovator in Integrated Circuit Testing
Introduction
Sounil Biswas is a notable inventor based in San Jose, CA (US), recognized for his contributions to the field of integrated circuit testing. With a total of 4 patents, he has made significant advancements in methods and systems that enhance the efficiency of scan testing in integrated circuits.
Latest Patents
His latest patents include a method, system, and device for serializing and de-serializing the delivery of scan test data through chip I/O. This innovation aims to reduce the scan test duration of an integrated circuit. The integrated circuit verification system he developed includes automatic test equipment (ATE) and a device under test (DUT) that features an internal test data de-serializer and test response data serializer. The DUT's de-serializer can de-serialize a test pattern or scan test data generated and received from an ATE at a general-purpose I/O pin of the DUT. It then serializes the response to the test data for output back to the ATE via the same or a different general-purpose I/O pin.
Another significant patent is the system and method for schedule-based I/O multiplexing for integrated circuit scan testing. This approach supports schedule-based I/O multiplexing for scan testing of an IC. A plurality of I/Os are assigned to various blocks in the IC for scan testing based on a set of slots under specific schedules. Each slot includes a fixed number of scan input and output pins of the IC, which are assigned to specific blocks for parallel scan testing.
Career Highlights
Sounil Biswas currently works at Marvell Asia Pte., Ltd., where he continues to innovate in the field of integrated circuits. His work has significantly impacted the efficiency and effectiveness of scan testing processes.
Collaborations
He collaborates with talented coworkers, including Amit Wangoo and Zhanwei Zhong, who contribute to the innovative environment at Marvell.
Conclusion
Sounil Biswas is a prominent figure in the realm of integrated circuit testing, with his patents reflecting a commitment to advancing technology in this field. His work continues to influence the efficiency of scan testing, showcasing the importance of innovation in engineering.