Company Filing History:
Years Active: 2018
Title: The Innovations of Sophia Hohlbauch
Introduction
Sophia Hohlbauch is a notable inventor based in Goleta, California. She has made significant contributions to the field of microscopy, particularly through her innovative work on automated atomic force microscopes. Her inventions have the potential to enhance the accuracy and efficiency of measurements in various scientific applications.
Latest Patents
Sophia holds a patent for an "Automated atomic force microscope and the operation thereof." This invention focuses on improvements for rapidly calibrating and automatically operating a scanning probe microscope. A central component of the scanning probe microscope (SPM) is the force transducer, typically a consumable cantilever element. By automatically calibrating transducer characteristics along with other instrumental parameters, scanning parameters can be rapidly and easily optimized. This results in high-throughput, repeatable, and accurate measurements. In contrast to dynamic optimization schemes, this can be accomplished before the surface is contacted, thereby avoiding tip or sample damage from the beginning of the measurement process. She has 1 patent to her name.
Career Highlights
Sophia Hohlbauch is currently employed at Oxford Instruments Asylum Research Inc., where she continues to develop innovative technologies in the field of microscopy. Her work has been instrumental in advancing the capabilities of atomic force microscopy, making it more accessible and efficient for researchers.
Collaborations
Throughout her career, Sophia has collaborated with esteemed colleagues such as Roger B Proksch and Roger Callahan. These collaborations have further enriched her work and contributed to the development of cutting-edge technologies in her field.
Conclusion
Sophia Hohlbauch's contributions to the field of microscopy through her innovative patents and collaborations highlight her role as a leading inventor. Her work continues to influence the scientific community and improve measurement techniques in various applications.