Soon-keun Jeon

Title: Innovations by Soon-keun Jeon

Introduction

Soon-keun Jeon is a notable inventor based in Suwon-si, South Korea. He has made significant contributions to the field of semiconductor memory technology. With a total of 2 patents, his work focuses on enhancing memory testing systems and methodologies.

Latest Patents

One of his latest patents is a memory test circuit and test system. This invention comprises a memory that outputs stored data through n-bit data output pins, along with a built-in self-test (BIST) unit. The BIST unit writes test data into the memory and compares the output with expected data to identify failure cell addresses. It generates k preliminary failure signals indicating whether the test data corresponds with the expected data, outputting these signals for m cycles of a clock signal. This innovative approach allows for efficient memory testing and failure analysis.

Another significant patent by Jeon is a method and apparatus for testing semiconductor memory devices that have multiple memory banks. This invention generates virtual addresses to differentiate the respective memory cell arrays within the semiconductor memory device. By sequentially reading data stored in the memory cells according to these virtual addresses, it becomes possible to identify the memory cell array containing a defective memory cell.

Career Highlights

Soon-keun Jeon is currently employed at Samsung Electronics Co., Ltd., a leading company in the technology sector. His work at Samsung has allowed him to contribute to advancements in memory technology, which is crucial for modern computing systems.

Collaborations

Jeon has collaborated with notable colleagues, including Sang-soo Kang and Yong-cheul Kim. Their teamwork has fostered innovation and development in the field of semiconductor memory testing.

Conclusion

Soon-keun Jeon is a prominent inventor whose work in memory testing technology has led to significant advancements in the field. His patents reflect a commitment to improving the reliability and efficiency of semiconductor memory devices.