The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2001
Filed:
Apr. 20, 1999
Applicant:
Inventors:
Soon-keun Jeon, Seoul, KR;
Sang-soo Kang, Kyungki-do, KR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 2/900 ; G11C 7/00 ;
U.S. Cl.
CPC ...
G11C 2/900 ; G11C 7/00 ;
Abstract
A method and apparatus for testing a semiconductor memory device having a plurality of memory banks are provided. Virtual addresses for differentiating the respective memory cell arrays are generated in the semiconductor memory device. The data stored in the memory cells of physical addresses is sequentially read according to the virtual addresses. Thus, it is possible to know the memory cell array to which a defective memory cell belongs.
Jeon, Soon-keun. (2001). Method and apparatus for testing semiconductor memory device having a plurality of memory banks (U.S. Patent No. 6247153). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6247153
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