Asan, South Korea

Soon-il Kwon

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Soon-il Kwon. Retrieved from https://idiyas.com/inventor/soon-il-kwon-2bmtsiua

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: The Innovations of Soon-il Kwon

Introduction

Soon-il Kwon is a notable inventor based in Asan, South Korea. He has made significant contributions to the field of semiconductor technology. His work focuses on improving the efficiency of testing semiconductor devices.

Latest Patents

Soon-il Kwon holds a patent for a "Test apparatus for semiconductor device and method of manufacturing semiconductor device." This invention provides a test board and a test system designed to efficiently test semiconductor packages. The apparatus includes a field programmable gate array (FPGA) that outputs data signals to the semiconductor device and a memory that stores test results. The FPGA is equipped with various components, including input/output blocks and a serializer/deserializer circuit, which enhance the testing process.

Career Highlights

Kwon is currently employed at Samsung Electronics Co., Ltd., a leading company in the technology sector. His work at Samsung has allowed him to contribute to advancements in semiconductor testing and manufacturing.

Collaborations

He has collaborated with colleagues such as Byeong-min Yu and Joo-sung Yun, who have also contributed to the field of semiconductor technology.

Conclusion

Soon-il Kwon's innovations in semiconductor testing demonstrate his expertise and commitment to advancing technology. His contributions are vital to the ongoing development of efficient semiconductor devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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