Sunnyvale, CA, United States of America

Songling Shin

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Applied Materials, Inc.. Active years: 2026.

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Songling Shin in Chemical Mechanical Polishing

Introduction

Songling Shin is an accomplished inventor based in Sunnyvale, CA. He has made significant contributions to the field of chemical mechanical polishing, particularly through his innovative patent. His work focuses on enhancing the efficiency and effectiveness of substrate cleaning processes.

Latest Patents

Songling Shin holds a patent for a "Method and apparatus to clean substrate with atomizing nozzle." This invention describes a chemical mechanical polishing system that includes a first polishing station with a platen to support a polishing pad. The system features a transfer station for receiving substrates from a robot, a movable carrier head, and a gas flow regulator for carrier gas. Additionally, it incorporates a liquid flow regulator for cleaning liquid and a fluid jet cleaner that utilizes an atomizing nozzle. This nozzle sprays cleaning liquid entrained in carrier gas onto the substrate, ensuring thorough cleaning during the polishing process. He has 1 patent to his name.

Career Highlights

Songling Shin is currently employed at Applied Materials, Inc., a leading company in the semiconductor and display industries. His role involves developing advanced technologies that improve manufacturing processes and product quality.

Collaborations

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Conclusion

Songling Shin's innovative contributions to chemical mechanical polishing demonstrate his expertise and commitment to advancing technology in the semiconductor industry. His patent reflects a significant step forward in substrate cleaning methods, showcasing the importance of innovation in manufacturing processes.

Profile summary based on public USPTO records.
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