Soham Dey

Title: The Innovative Journey of Soham Dey

Introduction

Soham Dey is a prominent inventor based in Fremont, CA, known for his contributions to the field of semiconductor manufacturing. His innovative spirit and expertise have led to significant advancements in predicting and controlling the quality of patterned wafers, which are crucial in the production of semiconductor devices.

Latest Patents

Soham Dey holds one noteworthy patent titled "Predicting and controlling critical dimension issues and pattern defectivity in wafers using interferometry." This invention introduces systems and methods for predicting and controlling pattern quality data, such as critical dimension and pattern defectivity, in patterned wafers. The technology employs patterned wafer geometry (PWG) measurements to establish correlations with pattern quality data. These insights enable predictions that can be utilized by lithography tools to correct focus and tilt errors during the lithography process, ensuring higher precision and quality in wafer production.

Career Highlights

Soham has made a significant impact at Kla Tencor Corporation, a leading company in the semiconductor manufacturing equipment industry. His patent reflects not only his technical expertise but also his commitment to improving manufacturing processes and outcomes in the semiconductor sector.

Collaborations

Throughout his career, Soham has collaborated with talented individuals such as Pradeep Vukkadala and Sathish Veeraraghavan. These collaborations highlight the importance of teamwork in driving innovation and addressing the complex challenges within semiconductor manufacturing.

Conclusion

Soham Dey's work exemplifies the power of innovation in advancing technology. His contributions to wafer quality control through his patented inventions continue to shape the future of semiconductor manufacturing, proving that dedication and creativity can lead to significant advancements within the industry.