Negeri Sembilan, Malaysia

Soh Ying Seah

This inventor holds 4 USPTO granted patents. Top assignees: Texas Instruments Corporation, Other. Active years: 2017-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Soh Ying Seah. Retrieved from https://idiyas.com/inventor/soh-ying-seah

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Location History:

  • Negeri Sembilan, MY (2017 - 2018)
  • Kuala Lumpur, MY (2020)

Company Filing History:


Years Active: 2017-2020

Loading Chart...
4 patents (USPTO):Explore Patents

Title: Soh Ying Seah: Innovator in Integrated Circuit Testing

Introduction

Soh Ying Seah is a notable inventor based in Negeri Sembilan, Malaysia. He has made significant contributions to the field of integrated circuit testing, holding a total of 4 patents. His innovative approaches have advanced the methods used in verifying the identity and functionality of semiconductor devices.

Latest Patents

One of Soh Ying Seah's latest patents is the "Multiple rate signature test to verify integrated circuit identity." This invention allows for the screening of a batch of integrated circuits (ICs) using test patterns provided in a sequence of test vectors. The process involves fetching the sequence from a memory connected to a tester, where bits from each test vector are utilized to form a test pattern. This pattern is then applied to an input pin of the device under test, allowing for the monitoring of the resulting signal on the output pin of each IC. A unique aspect of this patent is the method of screening slow-speed ICs by treating those that pass both fast and slow pattern tests as failures.

Another significant patent is the "Kill die subroutine at probe for reducing parametric failing devices at package test." This method involves testing semiconductor devices by contacting bond pads on a first die using a probe system. The testing includes various probe tests, such as parametric and continuity tests, and utilizes a kill die subroutine to selectively damage certain dies to generate continuity failures. This innovative approach helps in effectively binning the dies based on their performance.

Career Highlights

Soh Ying Seah has worked with prominent companies in the semiconductor industry, including Texas Instruments Corporation. His experience in these organizations has contributed to his expertise in integrated circuit technology and testing methodologies.

Collaborations

Throughout his career, Soh has collaborated with notable professionals in the field, including Gunvant Patel and Hoi Hin Loo. These collaborations have further enriched his work and innovations in integrated circuit testing.

Conclusion

Soh Ying Seah's contributions to the field of integrated circuit testing through his patents and collaborations highlight his role as an influential inventor. His innovative methods continue to impact the semiconductor industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…