Tokyo, Japan

So Kitazawa

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi Ge Vernova Nuclear Energy, Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: So Kitazawa. Retrieved from https://idiyas.com/inventor/so-kitazawa-ikl61ipy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: So Kitazawa: Innovator in Ultrasonic Pipe Inspection

Introduction

So Kitazawa is an inventor based in Tokyo, Japan, whose patent work concerns ultrasonic inspection technology. The supplied information identifies one patent associated with Kitazawa.

Latest Patents

Kitazawa’s patent, “Ultrasonic Inspection Apparatus and Method,” describes a system for estimating the depth of wall-thickness reduction in a pipe. A control device sends a pulse signal to one ultrasonic probe and processes a waveform received from another probe. It calculates the reduction depth by selectively using the reception time of an ultrasonic wave reflected once or twice from the pipe’s inner surface. This approach uses the differing signal paths to assess the pipe wall.

Career Highlights

Kitazawa is associated with Hitachi GE Vernova Nuclear Energy, Ltd. The supplied patent information highlights a contribution to ultrasonic inspection methods for evaluating pipe condition.

Collaborations

The listed coworkers are Kaname Saga and Akihiko Hirano. Their inclusion indicates professional connections in the context of Kitazawa’s work, though the supplied information does not specify their roles in the patent.

Conclusion

So Kitazawa’s patent applies ultrasonic signal timing to pipe-thickness assessment, reflecting an engineering contribution to inspection technology. The available information records 1 patent associated with Kitazawa.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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