The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Dec. 04, 2023
Applicant:

Hitachi GE Vernova Nuclear Energy, Ltd., Ibaraki, JP;

Inventors:

Kaname Saga, Tokyo, JP;

So Kitazawa, Tokyo, JP;

Akihiko Hirano, Hitachi, JP;

Yoshizumi Fukuhara, Hitachi, JP;

Junta Yamada, Hitachi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/07 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
G01N 29/07 (2013.01); G01N 29/2437 (2013.01); G01N 2291/02854 (2013.01);
Abstract

An ultrasonic inspection apparatus includes a control devicethat outputs a pulse signal for making an ultrasonic probeA transmit an ultrasonic wave to the ultrasonic probeA and that is supplied with a waveform signal obtained by converting the received ultrasonic wave from an ultrasonic probeB, and that computes a thickness reduction depth of a pipebetween the ultrasonic probeA and the ultrasonic probeB. The control devicecomputes the thickness reduction depth of the pipeby selectively using a reception time of the ultrasonic wave transmitted from the ultrasonic probeA, reflected once by an inner surfaceof the pipe, and received by the ultrasonic probeB, and a reception time of the ultrasonic wave transmitted from the ultrasonic probeA, reflected twice by the inner surfaceof the pipe, and received by the ultrasonic probeB.


Find Patent Forward Citations

Saga, Kaname. (2026). Ultrasonic inspection apparatus and method (U.S. Patent No. 12607604). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12607604

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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