This inventor holds 1 USPTO granted patent. Top assignee: University of Houston System. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: Innovations in Nanopatterning: The Contributions of Siyuan Tian
Introduction
Siyuan Tian is an accomplished inventor based in Houston, TX (US). He has made significant contributions to the field of nanopatterning, particularly through his innovative patent that enhances the fabrication of nanofeatures over large areas. His work is pivotal in advancing technologies that require precise patterning at the nanoscale.
Latest Patents
Siyuan Tian holds a patent titled "Systems and methods for rapidly fabricating nanopatterns in a parallel fashion over large areas." This patent focuses on nanopantography, a method that allows for the efficient patterning of nanofeatures. The technique utilizes highly selective plasma etching, with an oxide layer of silicon serving as a hard mask, to improve both the speed of patterning and the quality of the etch profile. This method enables the fabrication of high aspect ratio features without mask undercut, thereby enhancing the ability to create complex patterns quickly and effectively.
Career Highlights
Siyuan Tian is affiliated with the University of Houston System, where he continues to push the boundaries of research in nanopatterning. His innovative approaches have garnered attention in the scientific community, contributing to advancements in various applications that rely on nanotechnology.
Collaborations
Siyuan has collaborated with notable colleagues, including Demetre J Economou and Vincent M Donnelly. These partnerships have further enriched his research and have led to significant advancements in the field.
Conclusion
Siyuan Tian's contributions to nanopatterning through his innovative patent demonstrate his commitment to advancing technology in this critical area. His work not only enhances the efficiency of nanofabrication but also opens new avenues for research and application in various fields.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
