Company Filing History:
Years Active: 2017-2019
Title: Innovations by Inventor Sina Jahanbin
Introduction
Sina Jahanbin is a notable inventor based in San Jose, CA. He has made significant contributions to the field of process monitoring and inspection technologies. With a total of 2 patents, his work focuses on enhancing the efficiency and accuracy of manufacturing processes.
Latest Patents
Sina Jahanbin's latest patents include two innovative technologies. The first patent is titled "Feature selection and automated process window monitoring through outlier detection." This invention utilizes feature extraction and classification for process window monitoring. A classifier, based on combinations of metrics from masked die images, is capable of detecting process non-compliance. The classifier learns from nominal data to determine process status effectively.
The second patent is "Automated inline inspection and metrology using shadow-gram images." This technology employs shadow-grams for edge inspection and metrology of stacked wafers. The system consists of a light source directing collimated light at the edge of the stacked wafer, a detector opposite the light source, and a controller connected to the detector. The controller analyzes shadow-gram images to compare measurements of the silhouette of the stacked wafer against predetermined standards.
Career Highlights
Sina Jahanbin is currently employed at Kla Tencor Corporation, where he applies his expertise in process monitoring and inspection technologies. His work has contributed to advancements in the semiconductor industry, enhancing the quality and reliability of manufacturing processes.
Collaborations
Sina collaborates with talented professionals such as Himanshu Vajaria and Bradley Ries. Their teamwork fosters innovation and drives the development of cutting-edge technologies in their field.
Conclusion
Sina Jahanbin is a distinguished inventor whose patents reflect his commitment to improving manufacturing processes through innovative technologies. His contributions are shaping the future of process monitoring and inspection in the semiconductor industry.