Simon Voong

Title: Simon Voong - Innovator in Charged Particle Beam Systems

Introduction

Simon Voong is a notable inventor based in San Francisco, CA. He has made significant contributions to the field of charged particle beam systems. His innovative work focuses on enhancing the scanning control of these systems, which has implications for imaging and editing devices under test.

Latest Patents

Simon Voong holds a patent for an invention titled "Enhanced scanning control of charged particle beam systems." This patent describes a charged particle beam system that includes a charged particle beam generation unit, such as a focused ion beam (FIB) column. The system is designed to emit a charged particle beam onto a device under test (DUT). The invention features a scan controller arrangement that implements a finite state machine to control the application of the charged particle beam according to various scanning control parameters. These parameters can define rectangular scan regions or other shapes through a bit-map. The method for controlling the scanning involves obtaining a set of scanning control parameters and directing the charged particle beam accordingly.

Career Highlights

Simon Voong is currently employed at Credence Systems Corporation, where he continues to develop and refine technologies related to charged particle beam systems. His work has positioned him as a key player in the advancement of imaging technologies.

Collaborations

Some of Simon's coworkers include James Siebert and Lokesh Johri, who contribute to the innovative environment at Credence Systems Corporation.

Conclusion

Simon Voong's contributions to the field of charged particle beam systems demonstrate his commitment to innovation and technology advancement. His patent reflects a significant step forward in the capabilities of imaging and editing devices under test.