This inventor holds 4 USPTO granted patents. Top assignees: Texas Instruments Corporation, Other. Active years: 1987-1991.
Location History:
- Cambridge, GB (1987 - 1989)
- Bedford, GB (1991)
Company Filing History:
3 out of 29,835 
1 out of 834,307 Years Active: 1987-1991
Title: Simon C Garth: Innovator in Electron Beam Technology
Introduction
Simon C Garth is a notable inventor based in Cambridge, GB. He holds a total of 4 patents that showcase his contributions to the field of electron beam technology. His work has significantly impacted the testing and inspection of integrated circuits.
Latest Patents
One of Garth's latest patents is an "Electron beam apparatus and method for detecting secondary electrons." This innovative apparatus is designed for testing integrated circuits and utilizes a magnetic electron objective lens. The lens has a first end adjacent to the circuit under test and a second end that is remote from the circuit. The magnetic field of the lens increases steeply to a maximum near the first end and gradually falls towards the second end. Secondary electrons emitted from the circuit are accelerated by an electrostatic field into the first end of the lens and are retarded abruptly to speeds similar to their emission speeds in the region of maximum magnetic field. Further gradual retardation allows the electrons to approach the second end of the lens parallel to the axis at their emission speeds. A filter grid at the second end and a collector of electrons enable the measurement of the emission speeds of the secondary electrons.
Another significant patent is for the "Production of pulsed electron beams." This apparatus is particularly adapted for inspecting integrated circuits and includes a beam scanner that causes a continuous electron beam to scan a circle. The beam emerges from the second of three electrostatic lenses of an electron beam microscope. It then passes a deflecting means for deflecting the beam in a radial direction at selected locations before being collected to provide a pulsed electron beam.
Career Highlights
Throughout his career, Simon C Garth has worked with prominent companies, including Texas Instruments Corporation. His expertise in electron beam technology has made him a valuable asset in the field.
Collaborations
Garth has collaborated with notable individuals such as John N Sackett and Denis F Spicer. Their combined efforts have contributed to advancements in electron beam applications.
Conclusion
Simon C Garth's innovative work in electron beam technology has led to significant advancements in the testing and inspection of integrated circuits. His patents reflect his dedication to improving technology in this critical field.