Company Filing History:
3 out of 56 
1 out of 5 Years Active: 2004-2012
Title: Shyan-I Wu: Innovator in Electronic Element Testing
Introduction
Shyan-I Wu is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of electronic element testing, holding a total of 4 patents. His work focuses on developing advanced apparatuses and systems that enhance the efficiency and accuracy of electronic testing.
Latest Patents
One of Shyan-I Wu's latest patents is an apparatus, system, and method for testing electronic elements. This innovative electronic element testing apparatus is designed for use with multiple probes, each featuring a lower pole and an upper pole. The apparatus consists of a first plate with a first side and a second side. The first side is equipped with an array of lower pole regions, each configured to receive a lower pole of a probe. Additionally, it includes several signal conductor regions positioned near the array of lower pole regions. Each signal conductor region is arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are capable of sequentially connecting each electronic element to a testing circuit via the upper and lower poles.
Career Highlights
Throughout his career, Shyan-I Wu has worked with prominent companies in the semiconductor industry, including Vishay General Semiconductor, Inc. and General Semiconductor of Taiwan, Ltd. His experience in these organizations has contributed to his expertise in electronic testing technologies.
Collaborations
Shyan-I Wu has collaborated with several professionals in his field, including Kuang-Jung Li and Chin-Chen Hsu. These collaborations have likely enriched his work and led to further advancements in electronic testing methodologies.
Conclusion
Shyan-I Wu's innovative contributions to electronic element testing demonstrate his commitment to advancing technology in this field. His patents and career achievements reflect his expertise and dedication to improving electronic testing processes.