The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 2010
Filed:
Feb. 13, 2008
Kuang-jung LI, Taipei, TW;
Chin-chen Hsu, Taipei, TW;
Yi-li Lin, Taipei, TW;
Shyan-i Wu, Taipei, TW;
Kuang-Jung Li, Taipei, TW;
Chin-Chen Hsu, Taipei, TW;
Yi-Li Lin, Taipei, TW;
Shyan-I Wu, Taipei, TW;
Vishay General Semiconductor LLC, Hauppauge, NY (US);
Abstract
An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.