Company Filing History:
Years Active: 2017-2019
Title: Shuo Sun: Innovator in Defect Inspection Technologies
Introduction
Shuo Sun is a prominent inventor based in Fremont, CA, known for his contributions to defect inspection technologies. With a total of 3 patents, he has made significant advancements in methods and systems that enhance the efficiency and accuracy of wafer inspections.
Latest Patents
Shuo Sun's latest patents include innovative methods for selecting recipes for defect inspection. These methods involve scanning a full-stack wafer using various optical modes to obtain comprehensive images. The process includes de-processing the wafer to identify potential defects, thereby facilitating the selection of suitable optical modes for inspection. Another notable patent focuses on repeater detection, which provides systems and methods for identifying defects on a wafer. This method generates test images from scanned frame images and compares them to reference images to detect discrepancies, ultimately identifying defects in the wafer.
Career Highlights
Shuo Sun is currently employed at Kla Tencor Corporation, where he applies his expertise in defect inspection technologies. His work has contributed to the development of advanced inspection systems that are crucial for maintaining the quality of semiconductor manufacturing.
Collaborations
Shuo collaborates with notable colleagues, including Kenong Wu and Eugene Shifrin, who share his commitment to innovation in the field of defect inspection.
Conclusion
Shuo Sun's contributions to defect inspection technologies through his patents and work at Kla Tencor Corporation highlight his role as a key innovator in the industry. His advancements continue to influence the efficiency of semiconductor manufacturing processes.