Lutherville, MD, United States of America

Shunyou Long

This inventor holds 1 USPTO granted patent. Top assignee: Johns Hopkins University. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shunyou Long. Retrieved from https://idiyas.com/inventor/shunyou-long

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Shunyou Long: Innovator in Material Sampling Technologies

Introduction

Shunyou Long is a notable inventor based in Lutherville, MD (US). He has made significant contributions to the field of material sampling technologies. His innovative work has led to the development of a patent that enhances the efficiency of material storage and retrieval.

Latest Patents

Shunyou Long holds a patent titled "System and methods for sampling materials." This patent provides systems and methods for the storage, retrieval, and sampling of materials. His invention aims to streamline processes in various applications, making it easier to handle materials effectively.

Career Highlights

Shunyou Long is affiliated with Johns Hopkins University, where he continues to advance research in his field. His work at this prestigious institution has allowed him to collaborate with other leading experts and contribute to groundbreaking innovations.

Collaborations

Some of his notable coworkers include Jef D Boeke and Min Li. Their collaborative efforts have further enriched the research environment at Johns Hopkins University.

Conclusion

Shunyou Long's contributions to material sampling technologies exemplify the impact of innovative thinking in research and development. His patent and ongoing work continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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