The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2013
Filed:
Feb. 13, 2007
Applicants:
Jef D. Boeke, Baltimore, MD (US);
Min LI, Lutherville, MD (US);
Heng Zhu, Towson, MD (US);
Shunyou Long, Lutherville, MD (US);
Inventors:
Jef D. Boeke, Baltimore, MD (US);
Min Li, Lutherville, MD (US);
Heng Zhu, Towson, MD (US);
Shunyou Long, Lutherville, MD (US);
Assignee:
The Johns Hopkins University, Baltimore, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided herein are systems and methods for storage, retrieval and sampling of materials.
Boeke, Jef. (2013). System and methods for sampling materials (U.S. Patent No. 8616072). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8616072
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile