This inventor holds 1 USPTO granted patent. Top assignee: Gunze Limited. Active years: 1989.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1989
Title: Shunji Koike: Innovator in Fabric Inspection Technology
Introduction
Shunji Koike is a notable inventor based in Kyoto, Japan. He has made significant contributions to the field of fabric inspection technology. His innovative approach has led to the development of methods and apparatuses that enhance the quality control processes in textile manufacturing.
Latest Patents
Shunji Koike holds a patent for a "Fabric inspecting method and apparatus for detecting flaws." This invention focuses on an inspection method and apparatus designed to search for lump type and void type flaws on both faces of fabric in strip form. The technology employs strobes and image pickup elements arranged on opposite sides of the fabric during transportation. The strobes on one side emit light, while the image pickup elements on that side detect the light reflected by the fabric. Simultaneously, the image pickup elements on the opposite side detect light passing through the fabric. This dual approach allows for a comprehensive inspection of fabric quality.
Career Highlights
Shunji Koike is associated with Gunze Limited, a company known for its advancements in textile technology. His work at Gunze Limited has positioned him as a key player in the development of innovative solutions for fabric inspection.
Collaborations
Throughout his career, Shunji Koike has collaborated with talented individuals such as Hisao Itaya and Toshihiko Okada. These collaborations have contributed to the advancement of technology in the textile industry.
Conclusion
Shunji Koike's contributions to fabric inspection technology exemplify the importance of innovation in quality control processes. His patented methods and apparatuses continue to influence the textile industry, ensuring higher standards in fabric quality.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile