The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 1989
Filed:
Apr. 01, 1988
Applicant:
Inventors:
Hisao Itaya, Kyoto, JP;
Toshihiko Okada, Kyoto, JP;
Morishige Hata, Kyoto, JP;
Shunji Koike, Kyoto, JP;
Takahiro Onishi, Kyoto, JP;
Assignee:
Gunze Ltd., Kyoto, JP;
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358106 ; 26 70 ; 358101 ;
Abstract
An inspection method and apparatus for searching a fabric in strip form to find lump type and void type flaws on both faces of the fabric. Strobes and image pickup elements are arranged at opposite sides of the fabric in transportation. The strobes at one side of the fabric are caused to emit light, and the image pickup elements at the same side detect light reflected by the fabric while the image pickup elements at the other side detect light passing through the fabric.