This inventor holds 4 USPTO granted patents. Top assignee: Fujitsu Corporation. Active years: 1986-2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Yokohama, JP (1986 - 1991)
- Kawasaki, JP (1998 - 2000)
Company Filing History:
Years Active: 1986-2000
Title: Shunji Kashiwagi: Innovator in X-ray Measurement Technologies
Introduction
Shunji Kashiwagi is a prominent inventor based in Kawasaki, Japan. He has made significant contributions to the field of measurement technologies, particularly in the area of X-ray applications. With a total of 4 patents to his name, Kashiwagi's work has advanced the understanding and capabilities of element concentration measurement and film thickness evaluation.
Latest Patents
Kashiwagi's latest patents include an innovative element concentration measuring method and apparatus. This technology involves irradiating X-rays onto a sample that includes at least one layer of film on a substrate. The method measures the interference oscillation curve of the X-rays incident on the sample, allowing for the determination of the density of regions where elements are adhered or segregated. The concentration of the element is then computed based on this density.
Another notable patent is his film thickness measuring and film forming method. This method consists of measuring the reflectances of X-rays on a film, extracting interference oscillations, and applying Fourier transformation to compute the film thickness. The approach allows for the extraction of interference oscillations from the reflectance curve through a straightforward procedure, enhancing the accuracy of film thickness measurements.
Career Highlights
Shunji Kashiwagi is currently employed at Fujitsu Corporation, where he continues to develop and refine his innovative technologies. His work has not only contributed to the advancement of measurement techniques but has also positioned him as a key figure in the field of semiconductor research.
Collaborations
Kashiwagi has collaborated with notable colleagues, including Satoshi Komiya and Naoki Awaji. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Shunji Kashiwagi's contributions to X-ray measurement technologies have significantly impacted the field. His innovative patents and collaborative efforts continue to drive advancements in measurement techniques, showcasing his dedication to innovation and excellence.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile