Tokyo, Japan

Shunichiro Ishida

This inventor holds 1 USPTO granted patent. Top assignee: Nkk Corporation. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shunichiro Ishida. Retrieved from https://idiyas.com/inventor/shunichiro-ishida

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Shunichiro Ishida: Innovator in Pipe Inspection Technology

Introduction

Shunichiro Ishida is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of pipe inspection technology. His innovative approach focuses on detecting defects in pipes that are not externally visible.

Latest Patents

Ishida holds a patent for a method and apparatus for detecting defective portions on the outer surface of a pipe. This invention involves heating or cooling the inner surface of a pipe to create a temperature difference. The method allows for the identification of defects such as foreign matter accumulation or thinner sections on the outer surface, which are not directly visible.

Career Highlights

Ishida is associated with NKK Corporation, where he has applied his expertise in developing advanced inspection technologies. His work has been instrumental in enhancing the reliability and safety of piping systems.

Collaborations

Ishida has collaborated with notable colleagues, including Toshio Koshihara and Koji Ishihara. These partnerships have contributed to the advancement of innovative solutions in the field.

Conclusion

Shunichiro Ishida's contributions to pipe inspection technology exemplify the impact of innovation in engineering. His patented methods enhance the ability to detect defects, ensuring safer infrastructure.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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