The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 1991
Filed:
Mar. 07, 1989
Toshio Koshihara, Tokyo, JP;
Koji Ishihara, Tokyo, JP;
Toru Hirashima, Tokyo, JP;
Shunichiro Ishida, Tokyo, JP;
Haruhito Okamoto, Tokyo, JP;
Yuji Matoba, Tokyo, JP;
NKK Corporation, Tokyo, JP;
Abstract
A method and apparatus for detecting a defective portion on the outer surface not exposed of a pipe, which comprises: heating or cooling a pipe, the outer surface of which is not exposed, from the side of the inner surface thereof so that a difference in temperature is produced between a portion of the inner surface of the pipe corresponding to an accumulation of foreign matters or a thinner portion as a defective portion on the outer surface not exposed of the pipe and a portion of the inner surface of the pipe corresponding to a normal portion of the outer surface of the pipe; then shooting the inner surface of the pipe by means of a thermal imaging system while the difference in temperature still remains on the inner surface of the pipe to obtain a thermal image of the difference in temperature; and detecting the accumulation of foreign matters or the thinner portion as the defective portion on the outer surface of the pipe by means of the thus obtained thermal image.