Shumiao Sun

Title: Shumiao Sun: Innovator in Metal Detection Technology

Introduction

Shumiao Sun is a notable inventor based in Shanghai, China. He has made significant contributions to the field of metal detection technology, particularly through his innovative patent. His work focuses on enhancing the efficiency and accuracy of online detection methods.

Latest Patents

Shumiao Sun holds a patent for a "Test structure and test method for online detection of metal via open circuit." This invention provides a structure and method for detecting metal through an open circuit. The design includes a contact layer on a substrate, a first metal layer, and multiple metal via layers. The contact layer consists of several contacts connected to the first metal layer, while the first metal via layer contains multiple first vias filled with metal. The detection process utilizes E-beam technology, allowing for early identification of potential issues, thereby minimizing losses.

Career Highlights

Shumiao Sun is currently employed at Shanghai Huali Integrated Circuit Corporation. His role at the company allows him to apply his expertise in integrated circuit technology and metal detection systems. His innovative approach has positioned him as a valuable asset in the field.

Collaborations

Shumiao has collaborated with notable colleagues, including Zhigang Yang and Qing Zhang. Their combined efforts contribute to advancements in technology and innovation within their industry.

Conclusion

Shumiao Sun's contributions to metal detection technology exemplify the impact of innovative thinking in engineering. His patent reflects a commitment to solving real-world problems through advanced methodologies.