Hitachinaka, Japan

Shuichi Tanaka

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi Astemo Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shuichi Tanaka. Retrieved from https://idiyas.com/inventor/shuichi-tanaka-9as54pld

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Shuichi Tanaka

Introduction

Shuichi Tanaka is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of shape correction technology. His work focuses on enhancing the accuracy and efficiency of surface inspection devices.

Latest Patents

Tanaka holds a patent for a "Shape correction device and shape correction method based on amount of deformation measured by point measurement sensor and surface measurement sensor." This invention provides a surface inspection device that evaluates the shape of molded products with high accuracy in a shorter time than traditional methods. The device includes a point measurement sensor that measures predetermined points on the surface of an inspection target, a surface measurement sensor that simultaneously measures the shape of a predetermined surface, and a deformation amount computation unit that calculates the amount of deformation from a reference shape.

Career Highlights

Tanaka is currently employed at Hitachi Astemo Ltd., where he continues to innovate in the field of surface inspection technology. His work has been instrumental in advancing the capabilities of inspection devices, making them more efficient and reliable.

Collaborations

One of his notable coworkers is Tatsuhiko Kawakami, with whom he has likely collaborated on various projects within the company.

Conclusion

Shuichi Tanaka's contributions to the field of shape correction technology exemplify the importance of innovation in enhancing manufacturing processes. His patent reflects a commitment to improving accuracy and efficiency in surface inspection devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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