Company Filing History:
Years Active: 1982-2003
Title: Innovations by Shuichi Hanashima
Introduction
Shuichi Hanashima is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of data analysis systems, particularly in the context of inspection technologies. With a total of seven patents to his name, Hanashima's work has had a notable impact on the industry.
Latest Patents
One of Hanashima's latest patents is an inspection data analyzing system. This invention provides data analysis stations for both a probing tester and an automatic particle inspection machine. In the data analysis station, the coordinates that describe the disposition of the chips on a product basis are aligned with the locations of the defects. Additionally, the station includes a function that determines which chips each defect belongs to. These data analysis stations are interconnected through a communication line. The innovation allows for data analysis on a chip basis, enabling a better understanding of the relationship between defect causes and the product characteristics of the chips.
Career Highlights
Hanashima is currently employed at Hitachi, Ltd., where he continues to develop innovative solutions in the field of inspection technologies. His work has been instrumental in advancing the capabilities of data analysis systems, particularly in the semiconductor industry.
Collaborations
Throughout his career, Hanashima has collaborated with notable colleagues, including Seiji Ishikawa and Masao Sakata. These partnerships have contributed to the successful development of various technologies and patents.
Conclusion
Shuichi Hanashima's contributions to the field of data analysis and inspection technologies are significant. His innovative patents and collaborations reflect his dedication to advancing technology in the industry.