Shanghai, China

Shuangqing Li

This inventor holds 1 USPTO granted patent. Top assignee: Amlogic (Shanghai) Co., Ltd.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shuangqing Li. Retrieved from https://idiyas.com/inventor/shuangqing-li

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Shuangqing Li: Innovator in Crystal Frequency Calibration

Introduction

Shuangqing Li is a notable inventor based in Shanghai, China. He has made significant contributions to the field of technology, particularly in the calibration of crystal frequency offsets. His innovative approach has the potential to enhance the accuracy of measurements in various devices.

Latest Patents

Shuangqing Li holds a patent for a method titled "Method for calibrating crystal frequency offset through radio frequency signal." This method involves connecting a radio frequency port of a device to a WLAN tester through a radio frequency cable. The process allows users to test the radio frequency signal and determine if any deviations are qualified. If the signal is not qualified, adjustments can be made to the crystal circuit, ensuring more accurate measurements.

Career Highlights

Li is currently employed at Amlogic (Shanghai) Co., Ltd., where he continues to work on innovative solutions in technology. His expertise in crystal frequency calibration has positioned him as a valuable asset to his team and the company.

Collaborations

Shuangqing Li collaborates with talented coworkers, including Jie Feng and Kun Zhang. Their combined efforts contribute to the advancement of technology and innovation within their field.

Conclusion

Shuangqing Li's work in crystal frequency calibration exemplifies the impact of innovation in technology. His patent and contributions to Amlogic (Shanghai) Co., Ltd. highlight his dedication to improving measurement accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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