The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2022
Filed:
Oct. 31, 2018
Amlogic (Shanghai) Co., Ltd., Shanghai, CN;
Amlogic (Shanghai) Co., Ltd., Shanghai, CN;
Abstract
A method for calibrating crystal frequency offset through a radio frequency signal includes, in Step S1, a radio frequency port of a device is connected to one end of a radio frequency cable through a copper pipe connector and the other end of the radio frequency cable is connected to a Wireless Local Area Network (WLAN) tester which is connected with a control terminal. In Step S2, a user controls the WLAN tester to test the radio frequency signal of the device through the control terminal to obtain a test result, and determines whether a deviation of the radio frequency signal is qualified. If it is qualified, the user exits the test, otherwise the user regulates the crystal circuit of the device under test, and returns to Step S2. The method may not be affected by a probe, thus the measurement may be more accurate.