Kure, Japan

Shousei Miki

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Mitutoyo Corporation. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shousei Miki. Retrieved from https://idiyas.com/inventor/shousei-miki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Shousei Miki: Innovator in Surface Texture Measurement Technology

Introduction

Shousei Miki is a notable inventor based in Kure, Japan. He has made significant contributions to the field of surface texture measurement technology. His innovative approach has led to the development of a unique calibration method that enhances the accuracy of measurement devices.

Latest Patents

Miki holds a patent for a "Method of calibrating surface texture measurement device." This method involves obtaining Y-axis shape measurement data and a maximum diameter portion to derive upper and lower maximum diameter portions of a reference sphere. The process includes moving styluses in both the Y-axis and X-axis directions while in contact with the reference sphere, ultimately calculating offset amounts of the styluses from center coordinates obtained from the shape data. He has 1 patent to his name.

Career Highlights

Shousei Miki is associated with Mitutoyo Corporation, a leading company in precision measurement instruments. His work at Mitutoyo has allowed him to apply his innovative ideas in practical applications, contributing to advancements in measurement technology.

Collaborations

Miki collaborates with Yoshiyuki Omori, a fellow innovator in the field. Their partnership has fostered a creative environment that encourages the development of new technologies and methodologies.

Conclusion

Shousei Miki's contributions to surface texture measurement technology exemplify the impact of innovation in engineering. His patented methods and collaboration with peers continue to drive advancements in precision measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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