Ritto, Japan

Shojiro Kita

This inventor holds 1 USPTO granted patent. Top assignee: Ishida Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shojiro Kita. Retrieved from https://idiyas.com/inventor/shojiro-kita

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Shojiro Kita: Innovator in X-ray Inspection Technology

Introduction

Shojiro Kita is a notable inventor based in Ritto, Japan. He has made significant contributions to the field of X-ray inspection technology. His innovative approach has led to the development of a unique X-ray inspection apparatus.

Latest Patents

Kita holds a patent for an X-ray inspection apparatus. This apparatus includes a conveying unit designed to transport an article, an irradiation unit that emits X-rays onto the conveyed article, and a sensor unit with detecting elements arranged in a planar configuration. The image generation unit reads detection results from the sensor and generates an image. Additionally, a mode switching unit allows for the operation mode to switch between two power levels, enhancing the efficiency of the inspection process.

Career Highlights

Shojiro Kita is associated with Ishida Co., Ltd., a company known for its advancements in inspection technology. His work has contributed to the company's reputation for innovation in the field. With a patent count of 1 patent, Kita continues to push the boundaries of technology.

Collaborations

Kita has collaborated with talented coworkers such as Kota Tominaga and Futoshi Yurugi. Their combined expertise has fostered a creative environment that encourages innovation.

Conclusion

Shojiro Kita's contributions to X-ray inspection technology exemplify the spirit of innovation. His work not only enhances inspection processes but also showcases the importance of collaboration in technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…