The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Oct. 23, 2024
Ishida Co., Ltd., Kyoto, JP;
Futoshi Yurugi, Ritto, JP;
Kota Tominaga, Ritto, JP;
Shojiro Kita, Ritto, JP;
Satoshi Onda, Ritto, JP;
ISHIDA CO., LTD., Kyoto, JP;
Abstract
An X-ray inspection apparatus includes a conveying unit configured to convey an article, an irradiation unit configured to irradiate the article conveyed by the conveying unit with X-rays, a sensor unit in which detecting elements are arranged in a planar shape, an image generation unit configured to read detection results output from at least some of the detecting elements and generate an image, and a mode switching unit configured to switch an operation mode between a first mode in which a first electric power is supplied to the irradiation unit and a second mode in which a second electric power less than the first electric power is supplied to the irradiation unit, where the mode switching unit changes, when switching the operation mode from the first mode to the second mode, a read frequency at which the image generation unit reads the detection results.