This inventor holds 1 USPTO granted patent. Top assignee: Ishida Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Satoshi Onda - Innovator in X-ray Inspection Technology
Introduction
Satoshi Onda is a notable inventor based in Ritto, Japan. He has made significant contributions to the field of X-ray inspection technology. His innovative approach has led to the development of advanced inspection apparatuses that enhance the efficiency and accuracy of X-ray imaging.
Latest Patents
Satoshi Onda holds a patent for an X-ray inspection apparatus. This apparatus includes a conveying unit designed to transport an article, an irradiation unit that emits X-rays onto the conveyed article, and a sensor unit with detecting elements arranged in a planar configuration. The image generation unit reads detection results from the sensor and generates an image. Additionally, the mode switching unit allows for the operation mode to switch between two power levels, optimizing the inspection process.
Career Highlights
Onda is currently employed at Ishida Co., Ltd., where he continues to innovate in the field of inspection technology. His work has been instrumental in advancing the capabilities of X-ray inspection systems, making them more effective for various applications.
Collaborations
Some of his coworkers include Futoshi Yurugi and Shojiro Kita. Their collaborative efforts contribute to the ongoing development of cutting-edge technologies at Ishida Co., Ltd.
Conclusion
Satoshi Onda's contributions to X-ray inspection technology exemplify the impact of innovative thinking in engineering. His patent for the X-ray inspection apparatus showcases his commitment to enhancing inspection processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile