Location History:
- Saitama, JP (1992 - 1997)
- Tokyo, JP (2005 - 2008)
- Miyagi, JP (2007 - 2008)
Company Filing History:
Years Active: 1992-2008
Title: Shoji Niki – Innovator in Wavelength Measurement Technology
Introduction
Shoji Niki is a prominent inventor based in Tokyo, Japan, renowned for his significant contributions to the field of optical wavelength measurement technology. With a portfolio of 11 patents, Niki has showcased an impressive ability to innovate within his specialized domain.
Latest Patents
Niki's latest patents include a range of sophisticated devices and methods designed to enhance the precision of wavelength measurement. One of his key inventions is the "Wavelength Determining Device," which features a reference wavelength measuring section capable of determining the wavelength of second reference light based on the interference fringes generated by different light sources. Additionally, his work on the "Optical Frequency Measurement Apparatus" improves the accuracy of light frequency measurement through a coordinated system of coarse and fine frequency measurement.
Career Highlights
Throughout his career, Niki has been associated with Adv Antest Corporation, where he contributed to advancements in optical technologies. His background in working with leading corporations illustrates his capability in practical applications of his inventions, reinforcing his role as a significant player in the technology sphere.
Collaborations
Niki has collaborated with notable professionals in the field, including Takashi Kido and Shin Masuda. These partnerships have facilitated the exchange of ideas and have further propelled innovation in wavelength measurement and optical technologies.
Conclusion
Shoji Niki's work continues to impact the scientific community positively, particularly in the realm of optical technology. His patents reflect not only his inventive spirit but also his commitment to advancing precision measurement techniques. Through his ongoing contributions, Niki remains a remarkable figure in the innovation landscape of wavelength measurement.