The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2008

Filed:

Mar. 27, 2006
Applicants:

Shin Masuda, Miyagi, JP;

Shoji Niki, Miyagi, JP;

Inventors:

Shin Masuda, Miyagi, JP;

Shoji Niki, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a wavelength determining device including a reference wavelength measuring sectionthat, based upon a number A of interference fringes generated by an optical path difference of first reference wavelength light (wavelength: λ) and a number C of interference fringes generated by the optical path difference of second reference wavelength light (wavelength: λ), measures the wavelength of the second reference wavelength light, an input light wavelength measuring section, based upon the number A of the interference fringes generated by the optical path difference of the first reference wavelength light (wavelength: λ) and a number B of interference fringes generated by the optical path difference of input light (wavelength: λx), measures the wavelength of the input light, a correction coefficient determining sectionthat determines a second correction coefficient k based upon the measured wavelength λc of the second reference wavelength light and the measured wavelength λm of the input light, and an input light wavelength correcting sectionthat corrects the measured wavelength of the input light by multiplying the measured wavelength λm of the input light by the second correction coefficient k, in order to correctly measure the wavelength λx(=k·λm) of the input light.


Find Patent Forward Citations

Masuda, Shin. (2008). Wavelength determining device, wavelength meter equipped with the device, wavelength determining method, program, and recording medium (U.S. Patent No. 7423759). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7423759

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