This inventor holds 1 USPTO granted patent. Top assignees: Matsushita Electric Industrial Co., Ltd., Shinagawa Refractories Co., Ltd.. Active years: 1987.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 1987
Title: Shoichi Nishizawa: Innovator in Thermal Measurement Technology
Introduction
Shoichi Nishizawa is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of thermal measurement technology. His innovative work has led to the development of a unique apparatus designed for automatic measuring of thermal dimensional changes.
Latest Patents
Nishizawa holds a patent for an "Apparatus for automatic measuring thermal dimensional change." This apparatus is capable of measuring thermal dimensional changes from room temperature up to 2,000 degrees Celsius. It includes several key components: means for supporting and heating the specimen, means for measuring dimensional changes using a photo diode linear array and telescopic lens, and means for illuminating the specimen. The apparatus also features a light separation mechanism and processing means for calculating video signals that indicate measurement results. This invention showcases his expertise in precision measurement technology.
Career Highlights
Throughout his career, Nishizawa has worked with prominent companies such as Shinagawa Refractories Co., Ltd. and Matsushita Electric Industrial Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to various innovative projects.
Collaborations
Nishizawa has collaborated with notable individuals in his field, including Teiichi Fujiwara and Hiroshi Kyoden. These collaborations have further enhanced his work and contributed to advancements in thermal measurement technology.
Conclusion
Shoichi Nishizawa's contributions to thermal measurement technology through his innovative patent and collaborations highlight his importance in the field. His work continues to influence advancements in precision measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile