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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 4636969 B1

PDFFull Text
Date of Patent:
Jan. 13, 1987

Filed:

Sep. 17, 1985

Apparatus for automatic measuring thermal dimensional change

Applicant:
Inventors:

Hiroshi Kyoden, Okayama, JP;

Yasuhiro Endo, Bizen, JP;

Teiichi Fujiwara, Okayama, JP;

Toshisada Mimura, Okayama, JP;

Kihachiro Nishikawa, Yokohama, JP;

Shoichi Nishizawa, Yokohama, JP;

Assignees:

Shinagawa Refractories Co., Ltd., both of, JP;

Matsushita Electric Industrial Co., Ltd., both of, JP;

Attorney:

Larson and Taylor

Primary Examiner:

Daniel M Yasich

Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
364560 ; 250560 ; 356386 ; 374 55 ;
Abstract

An apparatus for automatic measuring thermal dimensional change from the room temperature to 2,000.degree. C., comprising, (a) means for supporting a specimen of the material to be tested and heating said specimen, (b) means for measuring the dimensional change of the specimen during heating said specimen, said measuring means having photo diode linear array and the telescopic lens for forming an image of the heated specimen, (c) means for illuminating the specimen from the opposite side of the photo diode linear array, said means having electric lamp and condensor lens, the radiation characteristic curve of said lamp being different from that of heated specimen, (d) means for separating the light forming image from the light radiated from said heated specimen, said means having light filter and neutral density filter between said specimen and said optical lens, (e) means for processing and calculating the video signal from the photo diode linear array indicating the results of measurements.

Find Patent Forward Citations

Kyoden, Hiroshi. (1987). Apparatus for automatic measuring thermal dimensional change (U.S. Patent No. 4636969). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4636969

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