This inventor holds 1 USPTO granted patent. Top assignees: Matsushita Electric Industrial Co., Ltd., Shinagawa Refractories Co., Ltd.. Active years: 1987.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 1987
Title: Kihachiro Nishikawa: Innovator in Thermal Measurement Technology
Introduction
Kihachiro Nishikawa is a notable inventor based in Yokohama, Japan. He is recognized for his contributions to the field of thermal measurement technology. His innovative approach has led to the development of a unique apparatus that measures thermal dimensional changes in materials.
Latest Patents
Nishikawa holds a patent for an "Apparatus for automatic measuring thermal dimensional change." This apparatus is designed to measure dimensional changes of a specimen from room temperature to 2,000 degrees Celsius. It includes several key components: means for supporting and heating the specimen, means for measuring dimensional changes using a photo diode linear array and telescopic lens, and means for illuminating the specimen. The apparatus also features a light separation mechanism and processing means for calculating video signals from the measurements. This invention showcases his expertise in precision measurement technology.
Career Highlights
Throughout his career, Kihachiro Nishikawa has worked with prominent companies such as Matsushita Electric Industrial Co., Ltd. and Shinagawa Refractories Co., Ltd. His experience in these organizations has contributed to his development as an inventor and innovator in the field.
Collaborations
Nishikawa has collaborated with notable individuals in his field, including Shoichi Nishizawa and Teiichi Fujiwara. These collaborations have likely enriched his work and expanded his contributions to thermal measurement technology.
Conclusion
Kihachiro Nishikawa's innovative work in thermal measurement technology has made a significant impact in his field. His patent for an apparatus that measures thermal dimensional changes exemplifies his expertise and dedication to advancing technology. His collaborations and career experiences further highlight his contributions to the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile