Shiyan Wu

Title: Shiyan Wu - Innovator in Microscopy Characterization

Introduction

Shiyan Wu is a notable inventor based in Wuhan, China. He has made significant contributions to the field of microscopy through his innovative methods. His work focuses on enhancing the characterization of structures using advanced techniques.

Latest Patents

Shiyan Wu holds a patent for a "Method for tilting characterization by microscopy." This patent outlines a method that includes measuring a first tilting shift of structures based on their initial arrangement. The structures are oriented vertically on a horizontal plane of a product. The method further involves measuring a second tilting shift based on a horizontal flip of the first arrangement. A corrected tilting shift is then determined using both measurements.

Career Highlights

Wu is currently employed at Yangtze Memory Technologies Co., Ltd., where he applies his expertise in microscopy. His work has been instrumental in advancing the understanding of structural characterization in various applications.

Collaborations

Shiyan Wu collaborates with talented colleagues, including Jun Liu and Yu Li, who contribute to his research and development efforts.

Conclusion

Shiyan Wu's innovative approach to microscopy characterization exemplifies the impact of dedicated inventors in advancing technology. His contributions continue to shape the field and inspire future innovations.