Shiran Gan-Or

Title: Shiran Gan-Or: Innovator in Semiconductor Classification

Introduction

Shiran Gan-Or is a notable inventor based in Ganei Tiqwa, Israel. She has made significant contributions to the field of semiconductor examination through her innovative methods of classifying defects. With a total of two patents to her name, her work is paving the way for advancements in semiconductor technology.

Latest Patents

Shiran's latest patents include a "Method of classifying defects in a specimen semiconductor examination and system thereof." This invention provides a classifier and method for classifying defects in semiconductor specimens. The method involves receiving defects classified into a majority class, selecting an attribute subset, and generating a training set to classify defects accurately. Her second patent, "Method of classifying defects in a semiconductor specimen and system thereof," enables assigning each class to a classification group with different priorities. This classifier optimizes classification results according to specific quality requirements for each class.

Career Highlights

Shiran Gan-Or is currently employed at Applied Materials Israel Limited, where she continues to develop her innovative ideas in semiconductor technology. Her work is instrumental in enhancing the accuracy and efficiency of defect classification in semiconductor manufacturing.

Collaborations

Shiran collaborates with talented individuals such as Assaf Asbag and Boaz Cohen, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Shiran Gan-Or's contributions to semiconductor classification are significant and impactful. Her patents reflect her dedication to advancing technology in this critical field.