This inventor holds 2 USPTO granted patents. Top assignees: Nippon Valqua Industries, Ltd., Tokyo Electron Limited. Active years: 2000-2008.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinya Sakurai. Retrieved from https://idiyas.com/inventor/shinya-sakurai-8p0ef0l0
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
% Patents Active = 100.0
Average Co-Inventor Count = 2.4
ph-index = 2
Forward Citations = 23(Granted Patents)
Location History:
- Yao, JP (2000)
- Gojo, JP (2008)
Company Filing History:
2 out of 58 
Nippon Valqua Industries, Ltd.
1 out of 10,918 
Tokyo Electron Limited
where one patent can have more than one assignee
Years Active: 2000-2008
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2 patents (USPTO):Explore Patents
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinya Sakurai. Retrieved from https://idiyas.com/inventor/shinya-sakurai-8p0ef0l0
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]